Título

RESIDUAL STRESS ANALYSIS BY DIFFERENT TENSIONS OF DLC FILMS ON TIAL6V4 AND 3016 STEEL ALLOYS

RESIDUAL STRESS ANALYSIS BY DIFFERENT TENSIONS OF DLC FILMS ON TIAL6V4 AND 3016 STEEL ALLOYS

Autoria

Campos, Joao Thiago de Guimaraes Anchieta e Araujo; Marques, Vagner Caetano Eduardo Caetano; Macau, Leandro; Corat, Evaldo José; Barquete, Danilo Maciel

DOI

10.5151/2594-5327-22963

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Resumo

Thin films are one the best choice to improve materials properties. Instead of entire replacement of the material in a component, which may be expensive, a coating process is a good option to achieve required properties precisely where they are required. Generally, coating depends on deposition methods which consist of chemical or physical interactions to form a film on substrate surface. Residual internal stresses are generated during cooling stage after deposition process, due to always present difference in thermal expansion coefficient of film and substrate materials. These stresses produce either failure or performance reduction on component utilization. Raman spectroscopy was used to evaluate these residual stresses. In this work Raman spectrum behavior was analyzed under different residual stress conditions of DLC films deposited on Titanium alloy (TiAl6V4) substrate. The comparative method used at three different bias tensions of -550 V, -650 V and -750 V showed that residual stress increases with increasing bias voltage but with a non-linear behaviour.

 

Thin films are one the best choice to improve materials properties. Instead of entire replacement of the material in a component, which may be expensive, a coating process is a good option to achieve required properties precisely where they are required. Generally, coating depends on deposition methods which consist of chemical or physical interactions to form a film on substrate surface. Residual internal stresses are generated during cooling stage after deposition process, due to always present difference in thermal expansion coefficient of film and substrate materials. These stresses produce either failure or performance reduction on component utilization. Raman spectroscopy was used to evaluate these residual stresses. In this work Raman spectrum behavior was analyzed under different residual stress conditions of DLC films deposited on Titanium alloy (TiAl6V4) substrate. The comparative method used at three different bias tensions of -550 V, -650 V and -750 V showed that residual stress increases with increasing bias voltage but with a non-linear behaviour.

Palavras-chave

Diamond-like carbon; Residual stress; 3016 steel alloy, TiAl6V4 alloy.

Diamond-like carbon; Residual stress; 3016 steel alloy, TiAl6V4 alloy.