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Proceedings of ABM Annual Congress


ISSN 2594-5327

59th Congresso anual Vol. 59 , num. 1 (2004)


Title

DAMAGE MECHANICS APPLICATION ON THE LED STRUCTURE DEGRADATION

DAMAGE MECHANICS APPLICATION ON THE LED STRUCTURE DEGRADATION

Authorship

DOI

10.5151/2594-5327-3949

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Abstract

LED structure degradation has been analyzed for many years. The structure degradation can occur for many different mechanisms including dark-line defects (DLD), dark spot defects (DSD), metal diffusion and shorts. A very important property of optical devices is its light-emitting power. Damage mechanics is applied to manage the light-emitting property during service conditions. Results of this management are useful to predict the device lifetime and to know the theorical value of operating hours.

 

LED structure degradation has been analyzed for many years. The structure degradation can occur for many different mechanisms including dark-line defects (DLD), dark spot defects (DSD), metal diffusion and shorts. A very important property of optical devices is its light-emitting power. Damage mechanics is applied to manage the light-emitting property during service conditions. Results of this management are useful to predict the device lifetime and to know the theorical value of operating hours.

Keywords

Damage Mechanics, Light-Emitting Diodes, Degradation

Damage Mechanics, Light-Emitting Diodes, Degradation

How to cite

Roncon, Edelcio T.; Deus, Enio Pontes de. DAMAGE MECHANICS APPLICATION ON THE LED STRUCTURE DEGRADATION, p. 2114-2121. In: 59th Congresso anual, São Paulo, Brasil, 2004.
ISSN: 2594-5327, DOI 10.5151/2594-5327-3949