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Proceedings of ABM Annual Congress


ISSN 2594-5327

58th Congresso anual Vol. 58 , num. 1 (2003)


Title

Gamma Prime Characterization in Nickel-Based Super-Alloys Through Image Analysis

Gamma Prime Characterization in Nickel-Based Super-Alloys Through Image Analysis

Authorship

DOI

10.5151/2594-5327-2859

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Abstract

The microstructure of a Ni-based super-alloy was studied through scanning electron microscopy and digital image analysis. A special procedure was developed to obtain the area fraction and size distribution of the γ′ phase, that is critical for the mechanical properties of these materials. Images were obtained both in secondary and back-scattered electrons modes, and automatically analyzed. Twelve images of each kind were treated, with more than 11000 measured particles. Results indicate strong differences in the measured parameters between the two imaging modes and suggest that back-scattered electrons provide more accurate values.

 

The microstructure of a Ni-based super-alloy was studied through scanning electron microscopy and digital image analysis. A special procedure was developed to obtain the area fraction and size distribution of the γ′ phase, that is critical for the mechanical properties of these materials. Images were obtained both in secondary and back-scattered electrons modes, and automatically analyzed. Twelve images of each kind were treated, with more than 11000 measured particles. Results indicate strong differences in the measured parameters between the two imaging modes and suggest that back-scattered electrons provide more accurate values.

Keywords

Ni-based super-alloys, gamma prime, SEM, image analysis

Ni-based super-alloys, gamma prime, SEM, image analysis

How to cite

Rezende, Tathiana; Paciornik, Sidnei. Gamma Prime Characterization in Nickel-Based Super-Alloys Through Image Analysis, p. 2257-2264. In: 58th Congresso anual, Rio de Janeiro, Brasil, 2003.
ISSN: 2594-5327, DOI 10.5151/2594-5327-2859